5962-9172501M3A | SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES in 28-pin FK package. Operational temperature range from -55°C to 125°C. | Datasheet*) |
SN74BCT8373ADW | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES in 24-pin DW package. Operational temperature range from 0°C to 70°C. | Datasheet*) |
SN74BCT8373ADWR | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES in 24-pin DW package. Operational temperature range from 0°C to 70°C. | Datasheet*) |
SN74BCT8373ANT | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES in 24-pin NT package. Operational temperature range from 0°C to 70°C. | Datasheet*) |
SNJ54BCT8373AFK | SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES in 28-pin FK package. Operational temperature range from -55°C to 125°C. | Datasheet*) |
SNJ54BCT8373AJT | SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES in 24-pin JT package. Operational temperature range from -55°C to 125°C. | Datasheet*) |
5962-9172501MLA | Scan Test Devices With Octal D-type Latches | Datasheet*) |
SN74BCT8373ADWE4 | IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches | Datasheet*) |
SN74BCT8373ADWRE4 | IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches | Datasheet*) |
SN74BCT8373ANTE4 | IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches | Datasheet*) |